Scanning electron microscopy and X-ray microanalysis Goldstein, Joseph I…[et al.]

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TextPublication details: New York Springer 2007Edition: 3rd edDescription: xix, 690pISBN:

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Holdings
Item type	Current library	Shelving location	Call number	Status	Date due	Barcode
Books	IIA Library-Bangalore	General Stacks	537.533.35/ GOL (Browse shelf(Opens below))	Available		17622

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Previous	537.531/ PIR The diffraction of X-rays and electrons by free molecules	537.531/ SPR X-Rays in practice	537.533.13/ THO Theory and practice of electron diffraction	537.533.35/ GOL Scanning electron microscopy and X-ray microanalysis	537.533/ HAW-1 Principles of electron optics vol. 1, basic geometrical optics	537.533/ HAW-2 Principles of electron optics vol. 2, applied geometrical optics	537.533/ HAW-3 Principles of electron optics vol. 3, wave optics	Next

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