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Scanning electron microscopy and X-ray microanalysis

Goldstein, Joseph I.

Scanning electron microscopy and X-ray microanalysis Goldstein, Joseph I…[et al.] - 3rd ed. - New York Springer 2007 - xix, 690p.

ISBN: 978-0-306-47292-3

Subjects--Topical Terms:
Electron microscopy
Electron rays
Qualitative X-ray analysis
X-ray microanalysis

Universal Decimal Class. No.: 537.533.35 / GOL

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