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Scanning electron microscopy and X-ray microanalysis Goldstein, Joseph I…[et al.]

By: Contributor(s): Material type: TextTextPublication details: New York Springer 2007Edition: 3rd edDescription: xix, 690pISBN:
  • 978-0-306-47292-3
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Holdings
Item type Current library Shelving location Call number Status Date due Barcode
Books Books IIA Library-Bangalore General Stacks 537.533.35/ GOL (Browse shelf(Opens below)) Available 17622

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