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		Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays [eBook] by Stover, John, ed Series: Proceedings of SPIE; V. 2862 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1996 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II [eBook] by Stover, John, ed Series: Proceedings of SPIE; V. 3275 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1998 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Scatter: Applications, Measurement, and Theory [eBook] by Stover, John, ed Series: Proceedings of SPIE; V. 1530 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1991 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Scattering in the Optics, Semiconductor, and Computer Disk Industries [eBook] by Stover, John, ed Series: Proceedings of SPIE; V. 2541 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1995 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Scattering: Applications, Measurement, and Theory II [eBook] by Stover, John, ed Series: Proceedings of SPIE; V. 1995 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1993 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Scatter from Optical Components [eBook] by Stover, John, ed Series: Proceedings of SPIE; V. 1165 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1990 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays [eBook] by Stover, John, ed Series: Proceedings of SPIE; V. 3619 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1999 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article

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