Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays [eBook]

By:

Material type: Text

TextSeries: Proceedings of SPIE; V. 2862Publication details: Washington, USA SPIE 1996Description: Online resourceISBN:

Online resources:

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Call number	Vol info	URL	Status	Date due	Barcode
eBooks	IIA Library-Bangalore		V. 2862	Link to resource	Available		EB4892

There are no comments on this title.

to post a comment.