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		Data Analysis and Modeling for Process Control [eBook] by Tobin, Kenneth, ed Series: Proceedings of SPIE; V. 5378 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2004 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Machine Vision Applications in Industrial Inspection VII [eBook] by Tobin, Kenneth, ed Series: Proceedings of SPIE; V. 3652 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1999 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Machine Vision Applications in Industrial Inspection VIII [eBook] by Tobin, Kenneth, ed Series: Proceedings of SPIE; V. 3966 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2000 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Metrology-based Control for Micro-Manufacturing [eBook] by Tobin, Kenneth, ed Series: Proceedings of SPIE; V. 4275 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2001 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Process and Materials Characterization and Diagnostics in IC Manufacturing [eBook] by Tobin, Kenneth, ed Series: Proceedings of SPIE; V. 5041 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2003 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Sixth International Conference on Quality Control by Artificial Vision [eBook] by Tobin, Kenneth, ed Series: Proceedings of SPIE; V. 5132 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2003 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article

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