8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics [eBook]

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Material type: Text

TextSeries: Proceedings of SPIE; V. 9687Publication details: Washington, USA SPIE 2016Description: Online resourceISBN:

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Holdings
Item type	Current library	Call number	Vol info	URL	Status	Date due	Barcode
eBooks	IIA Library-Bangalore		V. 9687	Link to resource	Available		EB2278

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