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8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics

Qian, Shinan, ed.

8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics [eBook] - Washington, USA SPIE 2016 - Online resource - Proceedings of SPIE; V. 9687 .

ISBN: 9781628419221 (Print)

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