Fundamentals of nanoscale film analysis Terry L. Alford, Leonard C. Feldman and James W. Mayer

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Material type: Text

TextPublication details: New York Springer 2007Description: xiv, 336pISBN:

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Holdings
Item type	Current library	Shelving location	Call number	Status	Date due	Barcode
Books	IIA Library-Bangalore	General Stacks	539.1/ ALF (Browse shelf(Opens below))	Available		17652

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