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Fundamentals of nanoscale film analysis

Alford, Terry L.

Fundamentals of nanoscale film analysis Terry L. Alford, Leonard C. Feldman and James W. Mayer - New York Springer 2007 - xiv, 336p.

ISBN: 978-0-387-29260-1

Subjects--Topical Terms:
Atomic physics
Electron diffraction
Electron interactions
Radiative transitions

Universal Decimal Class. No.: 539.1 / ALF

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