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		Instrumentation, Metrology, and Standards for Nanomanufacturing [eBook] by Postek, Michael, ed Series: Proceedings of SPIE; V. 6648 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2007 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Instrumentation, Metrology, and Standards for Nanomanufacturing II [eBook] by Postek, Michael, ed Series: Proceedings of SPIE; V. 7042 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2008 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Instrumentation, Metrology, and Standards for Nanomanufacturing III [eBook] by Postek, Michael, ed Series: Proceedings of SPIE; V. 7405 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2009 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Instrumentation, Metrology, and Standards for Nanomanufacturing IV [eBook] by Postek, Michael, ed Series: Proceedings of SPIE; V. 7767 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2010 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V [eBook] by Postek, Michael, ed Series: Proceedings of SPIE; V. 8105 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2011 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI [eBook] by Postek, Michael, ed Series: Proceedings of SPIE; V. 8466 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2012 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII [eBook] by Postek, Michael, ed Series: Proceedings of SPIE; V. 8819 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2013 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII [eBook] by Postek, Michael, ed Series: Proceedings of SPIE; V. 9173 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2014 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Integrated Circuit Metrology, Inspection, and Process Control VI [eBook] by Postek, Michael, ed Series: Proceedings of SPIE; V. 1673 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1992 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Integrated Circuit Metrology, Inspection, and Process Control VII [eBook] by Postek, Michael, ed Series: Proceedings of SPIE; V. 1926 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1993 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Microlithography and Metrology in Micromachining [eBook] by Postek, Michael, ed Series: Proceedings of SPIE; V. 2640 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1995 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Microlithography and Metrology in Micromachining II [eBook] by Postek, Michael, ed Series: Proceedings of SPIE; V. 2880 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1996 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences [eBook] by Postek, Michael, ed Series: Proceedings of SPIE; V. 8036 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2011 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences [eBook] by Postek, Michael, ed Series: Proceedings of SPIE; V. 8378 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2012 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences [eBook] by Postek, Michael, ed Series: Proceedings of SPIE; V. 8729 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2013 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Scanning Microscopies 2014 [eBook] by Postek, Michael, ed Series: Proceedings of SPIE; V. 9236 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2014 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Scanning Microscopies 2015 [eBook] by Postek, Michael, ed Series: Proceedings of SPIE; V. 9636 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2015 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Scanning Microscopy 2009 [eBook] by Postek, Michael, ed Series: Proceedings of SPIE; V. 7378 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2009 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Scanning Microscopy 2010 [eBook] by Postek, Michael, ed Series: Proceedings of SPIE; V. 7729 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2010 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article

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