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		3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems [eBook] by Han, Sen, ed Series: Proceedings of SPIE; V. 6724 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2007 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems [eBook] by Han, Sen, ed Series: Proceedings of SPIE; V. 7284 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2009 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		AOPC 2015: Optical Test, Measurement, and Equipment [eBook] by Han, Sen, ed Series: Proceedings of SPIE; V. 9677 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2015 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Measurement Technology and Instrumentation [eBook] by Han, Sen, ed Series: Proceedings of SPIE; V. 10155 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2016 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metrology and Inspection for Industrial Applications III [eBook] by Han, Sen, ed Series: Proceedings of SPIE; V. 9276 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2014 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metrology and Inspection for Industrial Applications IV [eBook] by Han, Sen, ed Series: Proceedings of SPIE; V. 10023 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2016 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metrology and Inspection for Industrial Applications V [eBook] by Han, Sen, ed Series: Proceedings of SPIE; V. 10819 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2018 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metrology and Inspection for Industrial Applications VI [eBook] by Han, Sen, ed Series: Proceedings of SPIE; V. 11189 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2020 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article

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