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Photomechanics and Speckle Metrology [eBook] by
  • Chiang, Fu-Pen, ed
Series: Proceedings of SPIE; V. 0814
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: Washington, USA SPIE 1987
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Availability: Items available for loan: IIA Library-Bangalore (1).

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Second International Conference on Photomechanics and Speckle Metrology [eBook] by
  • Chiang, Fu-Pen, ed
Series: Proceedings of SPIE; V. 1554
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: Washington, USA SPIE 1991
Online access:
Availability: Items available for loan: IIA Library-Bangalore (1).

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