Your search returned 4 results.

Sort
Unhighlight Highlight
Select all Clear all
Select titles to:
Results
Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices [eBook] by
  • Glembocki, Orest, ed
Series: Proceedings of SPIE; V. 0794
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: Washington, USA SPIE 1987
Online access:
Availability: Items available for loan: IIA Library-Bangalore (1).

Request article
Spectroscopic Characterization Techniques for Semiconductor Technology III [eBook] by
  • Glembocki, Orest, ed
Series: Proceedings of SPIE; V. 0946
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: Washington, USA SPIE 1988
Online access:
Availability: Items available for loan: IIA Library-Bangalore (1).

Request article
Spectroscopic Characterization Techniques for Semiconductor Technology IV [eBook] by
  • Glembocki, Orest, ed
Series: Proceedings of SPIE; V. 1678
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: Washington, USA SPIE 1992
Online access:
Availability: Items available for loan: IIA Library-Bangalore (1).

Request article
Spectroscopic Characterization Techniques for Semiconductor Technology V [eBook] by
  • Glembocki, Orest, ed
Series: Proceedings of SPIE; V. 2141
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: Washington, USA SPIE 1994
Online access:
Availability: Items available for loan: IIA Library-Bangalore (1).

Request article
Pages

Powered by Koha