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Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V [eBook] by
  • Wang, Shing-Chung, ed
Series: Proceedings of SPIE; V. 3945
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: Washington, USA SPIE 2000
Online access:
Availability: Items available for loan: IIA Library-Bangalore (1).

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Testing, Reliability, and Applications of Optoelectronic Devices [eBook] by
  • Wang, Shing-Chung, ed
Series: Proceedings of SPIE; V. 4285
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: Washington, USA SPIE 2001
Online access:
Availability: Items available for loan: IIA Library-Bangalore (1).

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