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Fringe pattern analysis proceedings of the SPIE held in Sandiago, California, on 08-09 August 1989 edited by Graeme T. Reid

By: Contributor(s): Material type: TextTextSeries: SPIE proceedings series; v. 1163Publication details: Washington Society of Photo-Optical Instrumentation Engineers 1989Description: vi, 260pISBN:
  • 0-8194-0199-4
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Holdings
Item type Current library Shelving location Call number Status Date due Barcode
Books Books IIA Library-Bangalore General Stacks 535(082.1)/ SPI-1163 (Browse shelf(Opens below)) Available 11011

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