Results of search for 'ccl=Provider:Washington'

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		Optical Methods, Sensors, Image Processing, and Visualization in Medicine [eBook] by Nowakowski, Antoni, ed Series: Proceedings of SPIE; V. 5505 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2004 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metro Networks and Short-Haul Systems [eBook] by Weiershausen, Werner, ed Series: Proceedings of SPIE; V. 7235 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2009 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metro Networks and Short-Haul Systems II [eBook] by Weiershausen, Werner, ed Series: Proceedings of SPIE; V. 7621 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2010 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metro Networks and Short-Haul Systems III [eBook] by Weiershausen, Werner, ed Series: Proceedings of SPIE; V. 7959 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2011 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metro Networks and Short-Haul Systems IV [eBook] by Weiershausen, Werner, ed Series: Proceedings of SPIE; V. 8283 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2011 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metro Networks and Short-Haul Systems IX [eBook] by Srivastava, Atul, ed Series: Proceedings of SPIE; V. 10129 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2017 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metro Networks and Short-Haul Systems V [eBook] by Weiershausen, Werner, ed Series: Proceedings of SPIE; V. 8646 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2012 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metro Networks and Short-Haul Systems VI [eBook] by Weiershausen, Werner, ed Series: Proceedings of SPIE; V. 9008 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2013 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metro Networks and Short-Haul Systems VII [eBook] by Srivastava, Atul, ed Series: Proceedings of SPIE; V. 9388 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2015 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metro Networks and Short-Haul Systems VIII [eBook] by Srivastava, Atul, ed Series: Proceedings of SPIE; V. 9773 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2016 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metrology and Inspection for Industrial Applications [eBook] by Harding, Kevin, ed Series: Proceedings of SPIE; V. 7855 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2010 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metrology and Inspection for Industrial Applications II [eBook] by Harding, Kevin, ed Series: Proceedings of SPIE; V. 8563 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2013 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metrology and Inspection for Industrial Applications III [eBook] by Han, Sen, ed Series: Proceedings of SPIE; V. 9276 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2014 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metrology and Inspection for Industrial Applications IV [eBook] by Han, Sen, ed Series: Proceedings of SPIE; V. 10023 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2016 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metrology and Inspection for Industrial Applications V [eBook] by Han, Sen, ed Series: Proceedings of SPIE; V. 10819 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2018 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metrology and Inspection for Industrial Applications VI [eBook] by Han, Sen, ed Series: Proceedings of SPIE; V. 11189 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2020 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metrology for Arts and Multimedia [eBook] by Salimbeni, Renzo, ed Series: Proceedings of SPIE; V. 5146 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2003 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metrology in Production Engineering [eBook] by Osten, Wolfgang, ed Series: Proceedings of SPIE; V. 5457 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2004 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries [eBook] by Al-Jumaily, Ghanim, ed Series: Proceedings of SPIE; V. 4099 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2000 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries II [eBook] by Duparré, Angela, ed Series: Proceedings of SPIE; V. 4449 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2001 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article

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