Results of search for 'ccl=Provider:Washington'

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		Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XI [eBook] by Sadwick, Laurence, ed Series: Proceedings of SPIE; V. 10531 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2018 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XII [eBook] by Sadwick, Laurence, ed Series: Proceedings of SPIE; V. 10917 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2019 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XIII [eBook] by Sadwick, Laurence, ed Series: Proceedings of SPIE; V. 11279 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2020 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Terrorism and Counter-Terrorism Methods and Technologies [eBook] by Ishimoto, Wade, ed Series: Proceedings of SPIE; V. 2933 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1997 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Test and Evaluation of Infrared Detectors and Arrays [eBook] by Hoke, Forney, ed Series: Proceedings of SPIE; V. 1108 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1989 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Test and Evaluation of IR Detectors and Arrays II [eBook] by Hoke, Forney, ed Series: Proceedings of SPIE; V. 1686 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1992 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Test and Measurement Applications of Optoelectronic Devices [eBook] by Chin, Aland, ed Series: Proceedings of SPIE; V. 4648 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2002 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV [eBook] by Fallahi, Mahmoud, ed Series: Proceedings of SPIE; V. 3626 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1999 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Testing, Reliability, and Application of Micro- and Nano-Material Systems [eBook] by Meyendorf, Norbert, ed Series: Proceedings of SPIE; V. 5045 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2003 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Testing, Reliability, and Application of Micro- and Nano-Material Systems II [eBook] by Meyendorf, Norbert, ed Series: Proceedings of SPIE; V. 5392 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2004 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Testing, Reliability, and Application of Micro- and Nano-Material Systems III [eBook] by Geer, Robert, ed Series: Proceedings of SPIE; V. 5766 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2005 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Testing, Reliability, and Application of Micro- and Nano-Material Systems IV [eBook] by Geer, Robert, ed Series: Proceedings of SPIE; V. 6175 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2006 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Testing, Reliability, and Applications of Optoelectronic Devices [eBook] by Wang, Shing-Chung, ed Series: Proceedings of SPIE; V. 4285 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 2001 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		Tests, Measurements, and Characterization of Electro-Optic Devices and Systems [eBook] by Wadekar, Shekhar, ed Series: Proceedings of SPIE; V. 1180 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1990 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		The 20th AIPR Workshop: Computer Vision Applications: Meeting the Challenges [eBook] by Lurie, Joan, ed Series: Proceedings of SPIE; V. 1623 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1992 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		The Aviation Security Problem and Related Technologies: A Critical Review [eBook] by Makky, Wagih, ed Series: Proceedings of SPIE; V. 10264 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1992 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		The Business Side of the Optical Industry I [eBook] by Scott, Roderic, ed Series: Proceedings of SPIE; V. 0071 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1976 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		The Business Side of the Optical Industry II [eBook] by Scott, Roderic, ed Series: Proceedings of SPIE; V. 0081 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1977 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		The Business Side of the Optical Industry III [eBook] by Scott, Roderic, ed Series: Proceedings of SPIE; V. 0111 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1977 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article
		The Business Side of the Optics Industry IV: Managing Engineering and Research [eBook] by , ed Series: Proceedings of SPIE; V. 0151 Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington, USA SPIE 1978 Online access: Click Here to Access eBook Availability: Items available for loan: IIA Library-Bangalore (1). Request article

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