IEEE Design & Test
IEEE Design & Test [eJournal]
- New York, USA The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
- Bimonthly
- 30(1); 2013 - Present
Subscribed through National Knowledge Resource Consortium (NKRC)
2168-2356 (Print) 2168-2364 (Online)
Components, Circuits, Devices and Systems
Computing and Processing
Subscribed through National Knowledge Resource Consortium (NKRC)
2168-2356 (Print) 2168-2364 (Online)
Components, Circuits, Devices and Systems
Computing and Processing