Normal view MARC view ISBD view

Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life

Chugui, Yuri, ed.

Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life [eBook] - Washington, USA SPIE 2002 - Online resource - Proceedings of SPIE; V. 4900 .

ISBN: 9780819446862 (Print)

Print
Request article
Suggest for purchase
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)