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Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences

Postek, Michael, ed.

Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences [eBook] - Washington, USA SPIE 2011 - Online resource - Proceedings of SPIE; V. 8036 .

ISBN: 9780819486103 (Print)

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