Normal view MARC view ISBD view

Advances in Metrology for X-Ray and EUV Optics

Assoufid, Lahsen, ed.

Advances in Metrology for X-Ray and EUV Optics [eBook] - Washington, USA SPIE 2005 - Online resource - Proceedings of SPIE; V. 5921 .

ISBN: 9780819459268 (Print)

Print
Request article
Suggest for purchase
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)