| 000 | 00596nam a2200217Ia 4500 | ||
|---|---|---|---|
| 003 | IN-BaIIA | ||
| 008 | 211028s9999 xx 000 0 eng d | ||
| 020 | _a0-12-014566-9 | ||
| 040 | _cIIA Library | ||
| 080 |
_a047.1:621.38 _bAEE-S6 |
||
| 100 |
_aTousimis, A.J _914658 |
||
| 245 | 0 |
_aElectron Probe Micro Analysis _cA. J Tousimis and F. Marton |
|
| 260 |
_aNew York _bAcademic Press _c1969 |
||
| 300 | _axii, 450p. | ||
| 650 |
_aElectron Probes _914659 |
||
| 650 |
_aElectronics _91576 |
||
| 650 | _aElectrophysics | ||
| 650 | _aNASA Thesaurus | ||
| 700 |
_aMarton, F. _914660 |
||
| 942 | _cBK | ||
| 999 |
_c8730 _d8730 |
||