| 000 | 00699nai a2200193Ia 4500 | ||
|---|---|---|---|
| 003 | IN-BaIIA | ||
| 008 | 211028c9999 xx s 000 0 eng d | ||
| 022 | _a0740-7475 (Print) | ||
| 022 | _a1558-1918 (Online) | ||
| 040 | _cIIA Library | ||
| 245 | 0 |
_aIEEE Design & Test of Computers _h[eJournal] |
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| 260 |
_aNew York, USA _bThe Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
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| 310 | _aBimonthly | ||
| 362 | _a1(1); 1984 - 29(6); 2012 | ||
| 521 | _bSubscribed through National Knowledge Resource Consortium (NKRC) | ||
| 650 |
_aComputing and Processing _948785 |
||
| 856 |
_uhttps://ieeexplore.ieee.org/servlet/opac?punumber=54 _yClick Here to Access eJournal |
||
| 942 | _cEJ | ||
| 999 |
_c34495 _d34495 |
||