000 00590nam a2200169Ia 4500
003 IN-BaIIA
008 211028s9999 xx s 000 0 eng d
020 _a9780892527250 (Print)
040 _cIIA Library
100 _aRusch, Thomas, ed.
_948768
245 0 _aX-Rays in Materials Analysis: Novel Applications and Recent Developments
_h[eBook]
260 _aWashington, USA
_bSPIE
_c1986
300 _aOnline resource
490 _aProceedings of SPIE; V. 0690
856 _uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/0690
_yClick Here to Access eBook
942 _cEB
999 _c33894
_d33894