000 00613nam a2200169Ia 4500
003 IN-BaIIA
008 211028s9999 xx s 000 0 eng d
020 _a9781628412376 (Print)
040 _cIIA Library
100 _aHau-Riege, Stefan, ed.
_948749
245 0 _aX-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II
_h[eBook]
260 _aWashington, USA
_bSPIE
_c2014
300 _aOnline resource
490 _aProceedings of SPIE; V. 9210
856 _uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/9210
_yClick Here to Access eBook
942 _cEB
999 _c33859
_d33859