000 00554nam a2200169Ia 4500
003 IN-BaIIA
008 211028s9999 xx s 000 0 eng d
020 _a9780819402004 (Print)
040 _cIIA Library
100 _aGreivenkamp, John, ed.
245 0 _aSurface Characterization and Testing II
_h[eBook]
260 _aWashington, USA
_bSPIE
_c1989
300 _aOnline resource
490 _aProceedings of SPIE; V. 1164
856 _uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/1164
_yClick Here to Access eBook
942 _cEB
999 _c32873
_d32873