000 00590nam a2200169Ia 4500
003 IN-BaIIA
008 211028s9999 xx s 000 0 eng d
020 _a9780819490919 (Print)
040 _cIIA Library
100 _aFernández Doval, Ángel, ed.
_948095
245 0 _aSpeckle 2012: V International Conference on Speckle Metrology
_h[eBook]
260 _aWashington, USA
_bSPIE
_c2012
300 _aOnline resource
490 _aProceedings of SPIE; V. 8413
856 _uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/8413
_yClick Here to Access eBook
942 _cEB
999 _c32748
_d32748