000 00590nam a2200169Ia 4500
003 IN-BaIIA
008 211028s9999 xx s 000 0 eng d
020 _a9780819406828 (Print)
040 _cIIA Library
100 _aChiang, Fu-Pen, ed.
_946980
245 0 _aSecond International Conference on Photomechanics and Speckle Metrology
_h[eBook]
260 _aWashington, USA
_bSPIE
_c1991
300 _aOnline resource
490 _aProceedings of SPIE; V. 1554
856 _uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/1554
_yClick Here to Access eBook
942 _cEB
999 _c31986
_d31986