000 00660nam a2200169Ia 4500
003 IN-BaIIA
008 211028s9999 xx s 000 0 eng d
020 _a9780819486103 (Print)
040 _cIIA Library
100 _aPostek, Michael, ed.
245 0 _aScanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
_h[eBook]
260 _aWashington, USA
_bSPIE
_c2011
300 _aOnline resource
490 _aProceedings of SPIE; V. 8036
856 _uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/8036
_yClick Here to Access eBook
942 _cEB
999 _c31944
_d31944