000 00590nam a2200169Ia 4500
003 IN-BaIIA
008 211028s9999 xx s 000 0 eng d
020 _a9780819456908 (Print)
040 _cIIA Library
100 _aTanner, Danelle, ed.
_947462
245 0 _aReliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV
_h[eBook]
260 _aWashington, USA
_bSPIE
_c2005
300 _aOnline resource
490 _aProceedings of SPIE; V. 5716
856 _uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/5716
_yClick Here to Access eBook
942 _cEB
999 _c31680
_d31680