000 00605nam a2200169Ia 4500
003 IN-BaIIA
008 211028s9999 xx s 000 0 eng d
020 _a9780819488930 (Print)
040 _cIIA Library
100 _aGarcĂ­a-Blanco, Sonia, ed.
245 0 _aReliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI
_h[eBook]
260 _aWashington, USA
_bSPIE
_c2012
300 _aOnline resource
490 _aProceedings of SPIE; V. 8250
856 _uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/8250
_yClick Here to Access eBook
942 _cEB
999 _c31679
_d31679