000 00612nam a2200169Ia 4500
003 IN-BaIIA
008 211028s9999 xx s 000 0 eng d
020 _a9780819432926 (Print)
040 _cIIA Library
100 _aPodio, Fernando, ed.
_947428
245 0 _aRecent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks
_h[eBook]
260 _aWashington, USA
_bSPIE
_c1999
300 _aOnline resource
490 _aProceedings of SPIE; V. 3806
856 _uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/3806
_yClick Here to Access eBook
942 _cEB
999 _c31623
_d31623