000 00555nam a2200169Ia 4500
003 IN-BaIIA
008 211028s9999 xx s 000 0 eng d
020 _a9780892528493 (Print)
040 _cIIA Library
100 _aChiang, Fu-Pen, ed.
_946980
245 0 _aPhotomechanics and Speckle Metrology
_h[eBook]
260 _aWashington, USA
_bSPIE
_c1987
300 _aOnline resource
490 _aProceedings of SPIE; V. 0814
856 _uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/0814
_yClick Here to Access eBook
942 _cEB
999 _c30799
_d30799