000 00602nam a2200169Ia 4500
003 IN-BaIIA
008 211028s9999 xx s 000 0 eng d
020 _a9780819441638 (Print)
040 _cIIA Library
100 _aDuparré, Angela, ed.
245 0 _aOptical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries II
_h[eBook]
260 _aWashington, USA
_bSPIE
_c2001
300 _aOnline resource
490 _aProceedings of SPIE; V. 4449
856 _uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/4449
_yClick Here to Access eBook
942 _cEB
999 _c29843
_d29843