000 00610nam a2200181Ia 4500
003 IN-BaIIA
008 211028s9999 xx s 000 0 eng d
020 _a9781510630956 (Print)
020 _a9781510630963 (Online)
040 _cIIA Library
100 _aHan, Sen, ed.
245 0 _aOptical Metrology and Inspection for Industrial Applications VI
_h[eBook]
260 _aWashington, USA
_bSPIE
_c2020
300 _aOnline resource
490 _aProceedings of SPIE; V. 11189
856 _uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/11189
_yClick Here to Access eBook
942 _cEB
999 _c29839
_d29839