000 00587nam a2200169Ia 4500
003 IN-BaIIA
008 211028s9999 xx s 000 0 eng d
020 _a9780819457325 (Print)
040 _cIIA Library
100 _aSilver, Richard, ed.
_945407
245 0 _aMetrology, Inspection, and Process Control for Microlithography XIX
_h[eBook]
260 _aWashington, USA
_bSPIE
_c2005
300 _aOnline resource
490 _aProceedings of SPIE; V. 5752
856 _uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/5752
_yClick Here to Access eBook
942 _cEB
999 _c28176
_d28176