000 00581nam a2200169Ia 4500
003 IN-BaIIA
008 211028s9999 xx s 000 0 eng d
020 _a9780819434814 (Print)
040 _cIIA Library
100 _aAjuria, Sergio, ed.
_944282
245 0 _aIn-Line Methods and Monitors for Process and Yield Improvement
_h[eBook]
260 _aWashington, USA
_bSPIE
_c1999
300 _aOnline resource
490 _aProceedings of SPIE; V. 3884
856 _uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/3884
_yClick Here to Access eBook
942 _cEB
999 _c26584
_d26584