000 00578nam a2200169Ia 4500
003 IN-BaIIA
008 211028s9999 xx s 000 0 eng d
020 _a9780892523849 (Print)
040 _cIIA Library
100 _aEbbeni, Jean, ed.
_944106
245 0 _aIndustrial Applications of Holographic Nondestructive Testing
_h[eBook]
260 _aWashington, USA
_bSPIE
_c1982
300 _aOnline resource
490 _aProceedings of SPIE; V. 0349
856 _uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/0349
_yClick Here to Access eBook
942 _cEB
999 _c26370
_d26370