000 00601nam a2200169Ia 4500
003 IN-BaIIA
008 211028s9999 xx s 000 0 eng d
020 _a9781510610323 (Online)
040 _cIIA Library
100 _aMonahan, Kevin, ed.
_943699
245 0 _aHandbook of Critical Dimension Metrology and Process Control: A Critical Review
_h[eBook]
260 _aWashington, USA
_bSPIE
_c1994
300 _aOnline resource
490 _aProceedings of SPIE; V. 10274
856 _uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/10274
_yClick Here to Access eBook
942 _cEB
999 _c25735
_d25735