000 00606nam a2200169Ia 4500
003 IN-BaIIA
008 211028s9999 xx s 000 0 eng d
020 _a9780819420992 (Print)
040 _cIIA Library
100 _aSeeger, David, ed.
_943139
245 0 _aElectron-Beam, X-Ray, EUV, and Ion-Beam Submicrometer Lithographies for Manufacturing VI
_h[eBook]
260 _aWashington, USA
_bSPIE
_c1996
300 _aOnline resource
490 _aProceedings of SPIE; V. 2723
856 _uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/2723
_yClick Here to Access eBook
942 _cEB
999 _c24963
_d24963