000 00608nam a2200169Ia 4500
003 IN-BaIIA
008 211028s9999 xx s 000 0 eng d
020 _a9780819417855 (Print)
040 _cIIA Library
100 _aWarlaumont, John, ed.
_943138
245 0 _aElectron-Beam, X-Ray, EUV, and Ion-Beam Submicrometer Lithographies for Manufacturing V
_h[eBook]
260 _aWashington, USA
_bSPIE
_c1995
300 _aOnline resource
490 _aProceedings of SPIE; V. 2437
856 _uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/2437
_yClick Here to Access eBook
942 _cEB
999 _c24962
_d24962