000 00577nam a2200169Ia 4500
003 IN-BaIIA
008 211028s9999 xx s 000 0 eng d
020 _a9780819428721 (Print)
040 _cIIA Library
100 _aPiché, Michel, ed.
_941843
245 0 _aAdvances in Optical Beam Characterization and Measurements
_h[eBook]
260 _aWashington, USA
_bSPIE
_c1998
300 _aOnline resource
490 _aProceedings of SPIE; V. 3418
856 _uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/3418
_yClick Here to Access eBook
942 _cEB
999 _c23289
_d23289