000 00612nam a2200181Ia 4500
003 IN-BaIIA
008 211028s9999 xx s 000 0 eng d
020 _a9781510612273 (Print)
020 _a9781510612280 (Online)
040 _cIIA Library
100 _aAssoufid, Lahsen, ed.
_941832
245 0 _aAdvances in Metrology for X-Ray and EUV Optics VII
_h[eBook]
260 _aWashington, USA
_bSPIE
_c2017
300 _aOnline resource
490 _aProceedings of SPIE; V. 10385
856 _uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/10385
_yClick Here to Access eBook
942 _cEB
999 _c23273
_d23273