| 000 | 00973nam a2200277Ia 4500 | ||
|---|---|---|---|
| 003 | IN-BaIIA | ||
| 008 | 211028s9999 xx s 000 0 eng d | ||
| 020 | _a978-3-642-29760-1 (Print) | ||
| 020 | _a978-3-642-29761-8 (Online) | ||
| 022 | _a1868-4513 (Print) | ||
| 022 | _a1868-4521 (Online) | ||
| 040 | _cIIA Library | ||
| 100 |
_aFultz, Brent _939732 |
||
| 245 | 0 |
_aTransmission Electron Microscopy and Diffractometry of Materials _h[eBook] |
|
| 260 |
_aHeidelberg, Berlin _bSpringer Berlin Heidelberg _c2013 |
||
| 300 | _aOnline resource | ||
| 490 | _aGraduate Texts in Physics | ||
| 650 |
_a Characterization and Evaluation of Materials _938380 |
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| 650 | _a Spectroscopy and Microscopy | ||
| 650 |
_a Spectroscopy/Spectrometry _938429 |
||
| 650 |
_a Surfaces and Interfaces, Thin Films _938400 |
||
| 650 |
_aPhysics _973 |
||
| 700 |
_aHowe, James _939733 |
||
| 856 |
_uhttp://doi.org/10.1007/978-3-642-29761-8 _yClick Here to Access eBook |
||
| 942 | _cEB | ||
| 999 |
_c21495 _d21495 |
||