000			00833nam a2200265Ia 4500
003			IN-BaIIA
008			211028s9999 xx 000 0 eng d
020			_a978-0-306-47292-3
040			_cIIA Library
080			_a537.533.35 _bGOL
100			_aGoldstein, Joseph I. _931142
245		0	_aScanning electron microscopy and X-ray microanalysis _cGoldstein, Joseph I…[et al.]
250			_a3rd ed.
260			_aNew York _bSpringer _c2007
300			_axix, 690p.
650			_aElectron microscopy _913844
650			_aElectron rays _931143
650			_aQualitative X-ray analysis _931144
650			_aX-ray microanalysis _931145
700			_aEchlin, P. _931146
700			_aJoy, D. C. _931147
700			_aLyman, C. E. _931148
700			_aNewbury, D. E. _931149
942			_cBK
999			_c16700 _d16700