000 00980nam a2200241Ia 4500
003 IN-BaIIA
008 211028s9999 xx 000 0 eng d
020 _a0-8194-4067-1
040 _cIIA Library
080 _a535(082.1)
_bSPI-4372
110 _aInternational Society for Optical Engineering
111 _aSociety of Photo-Optical Instrumentation Engineers Conference
_cOrlando, U.S.A.
_d2001 Apr. 18-19
_926397
245 0 _aInfrared imaging systems
_bdesign, analysis, modeling, and testing XII; proceedings of SPIE conference held in Orlando, U.S.A., April 18-19, 2001
_cedited by Gerald C. Holst
260 _aWashington, D. C.
_bThe International Society for Optical Engineering
_c2001
300 _av, 216p.
490 _aSPIE proceedings series; v. 4372
650 _aModeling
_926398
650 _aMultispectral image processing
_926399
650 _aSampling
_926400
650 _aTarget detection
_926401
700 _aHolst, Gerald C., ed.
_926402
942 _cBK
999 _c14737
_d14737