| 000 | 00611nam a2200205Ia 4500 | ||
|---|---|---|---|
| 003 | IN-BaIIA | ||
| 008 | 211028s9999 xx 000 0 eng d | ||
| 020 | _a0-8247-6003-4 | ||
| 040 | _cIIA Library | ||
| 080 |
_a535 _bSIR |
||
| 100 |
_aSirohi, R.S. _921524 |
||
| 245 | 0 |
_aOptical methods of measurement _bwholefield techniques _cR.S. Sirohi and F.S. Chau |
|
| 260 |
_aNew York _bMarcel Dekker _c1999 |
||
| 300 | _axiv, 323p. | ||
| 490 | _aOptical Engineering | ||
| 650 |
_ainterferometry _93249 |
||
| 650 | _aoptics | ||
| 700 |
_aChau, F.S _923496 |
||
| 942 | _cBK | ||
| 999 |
_c13400 _d13400 |
||