| 000 | 00882nam a2200217Ia 4500 | ||
|---|---|---|---|
| 003 | IN-BaIIA | ||
| 008 | 211028s9999 xx 000 0 eng d | ||
| 020 | _a0-8194-0199-4 | ||
| 040 | _cIIA Library | ||
| 080 |
_a535(082.1) _bSPI-1163 |
||
| 111 |
_aSociety of Photo-Optical Instrumentation Engineers Conference _cCalifornia _d1989 Aug. 08-09 _917095 |
||
| 245 | 0 |
_aFringe pattern analysis _bproceedings of the SPIE held in Sandiago, California, on 08-09 August 1989 _cedited by Graeme T. Reid |
|
| 260 |
_aWashington _bSociety of Photo-Optical Instrumentation Engineers _c1989 |
||
| 300 | _avi, 260p. | ||
| 490 | _aSPIE proceedings series; v. 1163 | ||
| 650 | _aAstronomy and Astrophysics Thesaurus | ||
| 650 |
_aFringe pattern _917096 |
||
| 650 |
_aImage processing techniques _913729 |
||
| 700 |
_aReid, Graeme T., ed. _917097 |
||
| 942 | _cBK | ||
| 999 |
_c10101 _d10101 |
||