TY  - DATA
TI  - Journal of Electronic Materials
SN  - 0361-5235
CY  - New York, USA
PB  - The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
N1  - Subscribed through National Knowledge Resource Consortium (NKRC)
UR  - https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7029
ER  -